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Journal of the Optical Society of Korea v.9 no.2, 2005년, pp.49 - 53   피인용횟수: 1

Reflection-type Optical Waveguide Index Profiling Technique

Youk YoungChun    (Department of Information and Communications, Gwangju Institute of Science and Technology   ); Kim Dug Young    (Department of Information and Communications, Gwangju Institute of Science and Technology  );
  • 초록

    We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode (LED) at 650 nm wavelength instead of a laser diode (LD) or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. We have obtained spatial resolution of 700 nm and an index precision of $2\times10^{-4}$ . To verify the system's capability, the refractive index profiles of a conventional multimode fiber and a home-made four-mode fiber were examined with our proposed measurement method.


  • 참고문헌 (11)

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    8. M. Calzavara, B. Costa and B. Sordo, 'Stability and noise improvement in reflectometric index measurement,' in Symposium on Optical Fiber Measurements, 5-8 (1980) 
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  • 이 논문을 인용한 문헌 (1)

    1. Jafar-Fard, Mohammad R. ; Moon, Sucbei 2012. "Measurement of Refractive Index Profile of Optical Fiber Using the Diffraction Phase Microscope" 한국광학회지 = Korean journal of optics and photonics, 23(4): 135~142     

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    3. 2005 "Mode Analysis and Modal Delay Measurement of a Few-Mode Fiber by Using Optical Frequency Domain Reflectometry" Journal of the Optical Society of Korea 9 (2): 54~58    

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