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KSTLE international journal v.7 no.1, 2006년, pp.5 - 9  

A Comparison of Friction Force Calibration in Lateral Force Microscope

Wang Yuli-Ang    (Tribology Research Center, Korea Institute of Science and Technology, Department of Mechatronic Engineering, Mechanic and Engineering School, Harbin Institute of Technology   ); Kim Hong-Joon    (Tribology Research Center, Korea Institute of Science and Technology   ); Kong Ho-Sung    (Tribology Research Center, Korea Institute of Science and Technology   ); Zhao Xu-Zheng    (Department of Mechatronic Engineering, Mechanic and Engineering School, Harbin Institute of Technology   ); Yoon Eui-Sung    (Tribology Research Center, Korea Institute of Science and Technology  );
  • 초록

    The main principle of two widely used methods which were proposed by Ruan and Bhushan, and by Ogletree and Carpick are introduced. Experiments were conducted using the two methods to measure friction force between AFM probe and silicon sample quantitatively. To characterize the frictional properties, the conversion factors of the two methods by which lateral electronic signal is converted into actual friction force were calculated. The experimental results show that that the conversion factors were extraordinarily different from each other. Further research should be done to identity the reasons for these differences.


  • 주제어

    nano .   tribology .   friction .   lateral force microscope .   calibration.  

  • 참고문헌 (12)

    1. Breakspear, S, Smith, J.R, Nevell, T.G, Tsibouklis, J., 'Friction Coefficient Mapping Using the Atomic Force Microscope', Surface and Interface Analysis 36, pp. 1330-1334,2004 
    2. Bogdanovic, G, Meurk, A., Rutland, M.W., 'Tip FrictionTorsional Spring Constant Determination', Elsevier Science B.V. 19, pp. 398-405, 2000 
    3. Bhushan, Bharat, Handbook of Micro/Nano Tribology. 2. CRC Press, 1999 
    4. Ruan, J, Bhushan, B., 'Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I-General Principles and New Measurement Techniques', Journal of Tribology 116(2), pp. 378-, 1994 
    5. Meyer, G, Amer, N.M., 'Simultaneous Measurement of Lateral and Normal Forces with An Optical-Beam- Deflection Atomic Force Microscope', Applied Physics Letter 57(20), 1990 
    6. Liu, Y, Wu, T, Ewans, D.F., 'Lateral Force Microscopy on the Shear Properties of Self-Assembled Monolayers of Dialkylammonium Surfactant on Mica', Langmuir 10, pp. 2241-2245, 1994 
    7. Neumeister, J.M, Ducker, W. A., 'Lateral, normal, and Longitudinal spring constants of atomic force microscopy cantilevers', American Institute of Physics 65(8), pp. 2527-2531, 1994 
    8. Cain, R.G, Biggs, S, Page, N.W.,. 'Force Calibration in Lateral Force Microscopy', Journal of Colloid and Interface Science 227, pp. 55-65, 2000 
    9. Varenberg, M, Etsion, I, Halperin, G.., 'An Improved Wedge Calibration Method for Lateral Force in Atomic Force Microscopy', Review of Scientific Instruments 74(7), pp. 3362-3367, 2003 
    10. Liu, E, Blanpain, B, Celis, J.P., 'Calibration Procedures for Frictional Measurements with A Lateral Force Microscope', Wear 192, pp. 141-150, 1996 
    11. Carpick, R.W, Ogletree, D.F, Salmeron, M., 'A New Nanomechanical Measurement for the Determination of Shear Strengths with Friction Force Microscopy', Applied Physics Letter 70(12), pp. 1548-1550, 1997 
    12. Ogletree, D.F, Carpick, R.W, Salmeron, M., 'Calibration of Friction Forces in Atomic Force Microscopy', Review of Scientific Instrument 67(9), pp. 3298-3386, 1996 

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