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Incremental Model-based Test Suite Reduction with Formal Concept Analysis

Ng, Pin    (Hong Kong Community College, Hong Kong Polytechnic University   ); Fung, Richard Y.K.    (Dept. of Manufacturing Engineering and Engineering Management, City University of Hong Kong   ); Kong, Ray W.M.    (Automatic Manufacturing Limited  );
  • 초록

    Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios and a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to determine incrementally a minimal set of test scenarios with adequate test coverage.


  • 주제어

    Test Suite Reduction .   Model-based Testing .   State Machine Model .   Formal Concept Analysis.  

  • 참고문헌 (16)

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