Generating tests for delay faults in nonscan circuits
A delay test method that allows any sequential-circuit test generation program to produce path delay tests for nonscan circuits is presented. Using this method, a given path is tested by augmenting the netlist model of the circuit with a logic block, in which testing for a certain single stuck-at fault is equivalent to testing for a path delay fault. The test sequence for the stuck-at fault performs all the necessary delay fault test functions: initialization, path activation, and fault propagation. Results on benchmarks are presented for nonscan and scan/hold modes of testing.