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Optics communications v.390, 2017년, pp.88 - 98   SCI SCIE
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Surface defects evaluation system based on electromagnetic model simulation and inverse-recognition calibration method

Yang, Y. Chai, H. Li, C. Zhang, Y. Wu, F. Bai, J. Shen, Y.
  • 초록  

    Digitized evaluation of micro sparse defects on large fine optical surfaces is one of the challenges in the field of optical manufacturing and inspection. The surface defects evaluation system (SDES) for large fine optical surfaces is developed based on our previously reported work. In this paper, the electromagnetic simulation model based on Finite-Difference Time-Domain (FDTD) for vector diffraction theory is firstly established to study the law of microscopic scattering dark-field imaging. Given the aberration in actual optical systems, point spread function (PSF) approximated by a Gaussian function is introduced in the extrapolation from the near field to the far field and the scatter intensity distribution in the image plane is deduced. Analysis shows that both diffraction-broadening imaging and geometrical imaging should be considered in precise size evaluation of defects. Thus, a novel inverse-recognition calibration method is put forward to avoid confusion caused by diffraction-broadening effect. The evaluation method is applied to quantitative evaluation of defects information. The evaluation results of samples of many materials by SDES are compared with those by OLYMPUS microscope to verify the micron-scale resolution and precision. The established system has been applied to inspect defects on large fine optical surfaces and can achieve defects inspection of surfaces as large as 850mmx500mm with the resolution of 0.5@?m.


  • 주제어

    Surface defects .   Microscopic scattering dark-field imaging .   Finite-difference time-domain .   Inverse-recognition calibration method.  

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