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IEEE photonics journal v.9 no.1, 2017년, pp.1 - 11   SCIE
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Effective Mass Sensing Using Optomechanically Induced Transparency in Microresonator System

Gao, Yong-Pan (School of Science and the State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing, China ) ; Wang, Tie-Jun (School of Science and the State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing, China ) ; Cao, Cong (School of Science and the State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing, China ) ; Mi, Si-Chen (School of Science and the State Key Laboratory of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, Beijing, China ) ; Yang, Daquan (State Key Laboratory of Information Photonics and Optical Communications, School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing, China ) ; Zhang, Yong (School of Science, Beijing University of Posts and Telecommunications, Beijing, China ) ; Wang, Chuan (School of Science and the State Key Labo ) ;
  • 초록  

    Detecting and weighing individual nanoparticles is an important approach to studying the behavior and properties of single particles. Here, we illustrate an effective mass sensing scheme using optomechanical resonator system. Based on the optomechanically induced transparency phenomenon, a Stokes’ field reference approach is used to sense the mass of the particle on the microresonator. The field intensity of the transmission field will be changed by the effect of the particle, which avoids the limits of decay-induced spectral width in the resonance shift detection. Exploiting the perturbation method, we theoretically evaluated the dynamical behavior of the system and achieved femtogram-level mass sensing without the need for high cavity $Q$ -value, as well as strong coupling strength in the optomechanical system.


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