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Surface and interface analysis : SIA 12건

  1. [해외논문]   Cover Image, Volume 50, Issue 8  

    Sameshima, Junichiro , Yoshikawa, Masanobu
    Surface and interface analysis : SIA v.50 no.8 ,pp. i - i , 2018 , 0142-2421 ,

    초록

    The cover image, by Junichiro Sameshima and Masanobu Yoshikawa, is based on the Research Article An effect of residual gas component on detected secondary ions during TOF‐SIMS depth profiling and a method to estimate contained component, https://doi.org/10.1002/sia.6479 .

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  2. [해외논문]   Issue Information  


    Surface and interface analysis : SIA v.50 no.8 ,pp. 767 - 769 , 2018 , 0142-2421 ,

    초록

    No abstract is available for this article.

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  3. [해외논문]   Effects of surface synergy for the dispersion of short carbon fibers sized by adipic acid modified epoxy resin potassium  

    Wu, Bo (School of Textile, Tianjin Polytechnic University, Tianjin, 300387, China) , Zheng, Guo (School of Textile, Tianjin Polytechnic University, Tianjin, 300387, China) , Wang, Rui (School of Textile, Tianjin Polytechnic University, Tianjin, 300387, China) , Zhou, Cun (School of Textile, Tianjin Polytechnic University, Tianjin, 300387, China) , Zhu, Jiawen (Tianjin Engineering Research Center of Textile Fiber Interface Treatment Technology, Tianjin, 300270, China) , Liu, Huibing (Tianjin Engineering Research Center of Textile Fiber Interface Treatment Technology, Tianjin, 300270, China)
    Surface and interface analysis : SIA v.50 no.8 ,pp. 771 - 778 , 2018 , 0142-2421 ,

    초록

    The carbon fiber (CF) surface plays a critical role in the performance of CF composite materials. Adipic acid modified epoxy resin potassium (AAEK) prepared with epoxy resin and adipic acid, and KOH was employed as the CF sizing agent. Then, series of surface properties of AAEK‐treated carbon fiber (CF‐AAEK) including surface charge, morphology, and groups were characterized by using Faraday cup, friction coefficient gauge, atomic force microscopy, X‐ray photoelectron spectroscopy, and thermogravimetry. The results indicated that the dispersion coefficient of CF‐AAEK was increased by 1.72 times and there were synergistic effects for the dispersion of short CFs during the sizing treatment process with AAEK. In addition, the flexural strength of treated short CF composite proved to increase by 168%, which evaluated that the better CF dispersion in the matrix was a critical factor for the mechanical property improvement of short CF‐AAEK/epoxy resin composites.

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  4. [해외논문]   Theoretical and experimental approach of inhibition effect by sulfamethoxazole on mild steel corrosion in 1‐M HCl  

    Prasanna, B.M. (Department of Chemistry, Jain Institute of Technology, Davanagere, 577003, India) , Praveen, B.M. (Departement of Chemistry, College of Engineering and Technology, Srinivas University, Mukka, Mangalore, 574146, India) , Hebbar, Narayan (Departement of Chemistry, College of Engineering and Technology, Srinivas University, Mukka, Mangalore, 574146, India) , Pavithra, M.K. (Department of studies in Chemistry, Kuvempu University, Shankaraghatta, Shimoga, 577451, India) , Manjunatha, T.S. (Department of Mechanical Engineering, Jain Institute of Technology, Davanagere, 577003, India) , Malladi, R.S. (Department of studies in Chemistry, BLDEA'S V.P. Dr. P. G. Halakatti College of Engineering and Technology, Bijapur, Karnataka, 586101, India)
    Surface and interface analysis : SIA v.50 no.8 ,pp. 779 - 789 , 2018 , 0142-2421 ,

    초록

    The inhibition effect of sulfamethoxazole on mild steel corrosion in 1‐M hydrochloric acid solution is investigated by electrochemical and quantum chemical measurements. Electrochemical polarization studies show that sulfamethoxazole acts as a mixed‐type corrosion inhibitor. The adsorption of the inhibitor on mild steel in 1‐M hydrochloric acid system is studied at different temperatures (303‐333 K). The adsorption of sulfamethoxazole on mild steel surface is an exothermic process and obeys the Temkin adsorption isotherm. Based on the potential of zero charge values and quantum chemical parameters, the mechanism of adsorption is proposed.

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  5. [해외논문]   Temperature‐dependent local atomic structures in the traditional Fe65Ni35 Invar alloy by X‐ray fluorescence holography  

    Stellhorn, Jens Rü , diger , Ideguchi, Yuuki , Hosokawa, Shinya (Graduate School of Information Sciences, Hiroshima City University, Hiroshima 731‐3194, Japan) , Happo, Naohisa (Japan Synchrotron Radiation Research Institute (JASRI), Sayo 679‐5198, Japan) , Matsushita, Tomohiro (Institute for Materials Research, Tohoku University, Sendai 980‐8577, Japan) , Yubuta, Kunio (Japan Synchrotron Radiation Research Institute (JASRI), Sayo 679‐5198, Japan) , Suzuki, Motohiro (National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan) , Ishii, Hirofumi (National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan) , Liao, Yen‐ (Department of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466‐8555, Japan) , Fa , Kimura, Koji , Hayashi, Kouichi
    Surface and interface analysis : SIA v.50 no.8 ,pp. 790 - 794 , 2018 , 0142-2421 ,

    초록

    Fe and Ni K α X‐ray fluorescence holography measurements were conducted on a single crystal Fe 65 Ni 35 Invar alloy at 100 and 300 K to investigate the temperature dependence of the 3‐dimensional local structures around the Fe and Ni atoms, respectively. Local structural information was obtained by detailed analyses using a L 1 ‐regularized linear regression for the experimental data. At 100 K, the local atomic arrangements around both the elements show f c c structures. At 300 K, however, only the image around Fe shows a b c c ‐like neighboring arrangement. From these X‐ray fluorescence holography data, we propose a model that with increasing temperature, an Fe atom with the low‐spin state enters at the central position of the f c c lattice and is stabilized. And then, large angular positional fluctuations are induced for the atoms at the face‐centered positions around the central Fe atom only.

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  6. [해외논문]   XPS study of the SnO2 films modified with Rh  

    Korotcenkov, G. (Department of Theoretical Physics, Moldova State University, Chisinau, Moldova) , Brinzari, V. (Department of Theoretical Physics, Moldova State University, Chisinau, Moldova) , Hanyš (ON Semiconductor, SCG Czech Design Center, Roznov pod Radhostem, Czech Republic) , , P. (Department of Surface and Plasma Science, Charles University, Prague, Czech Republic) , Nehasil, V.
    Surface and interface analysis : SIA v.50 no.8 ,pp. 795 - 801 , 2018 , 0142-2421 ,

    초록

    In this paper, we have analyzed the effect of the rhodium surface modification on the surface state of SnO 2 films. SnO 2 films, subjected for the surface modification, were deposited by spray pyrolysis, while Rh was deposited by using a microelectron beam evaporation. The thickness of the Rh coating varied in the range 0 to 0.1 monolayer. An explanation of the observed effects was proposed. Basing on the results of X‐ray photoelectron spectroscopy, it was assumed that at a small thickness of the rhodium covering, Rh was in a the well‐dispersed state, close to atomically dispersed state. The growth in the size of the nanoparticles began mainly when the thickness of the Rh covering exceeeded 0.01 monolayer. The size of clusters did not exceed 0.5 to 1.0 nm.

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  7. [해외논문]   An effect of residual gas component on detected secondary ions during TOF‐SIMS depth profiling and a method to estimate contained component  

    Sameshima, Junichiro (Toray Research Center, Inc., Surface Science Laboratory, 3‐3‐7 Sonoyama, Otsu, Shiga, 520‐8567, Japan) , Yoshikawa, Masanobu (Toray Research Center, Inc., Surface Science Laboratory, 3‐3‐7 Sonoyama, Otsu, Shiga, 520‐8567, Japan)
    Surface and interface analysis : SIA v.50 no.8 ,pp. 802 - 806 , 2018 , 0142-2421 ,

    초록

    With regard to Secondary Ion Mass Spectroscopy (SIMS) measurement of atmospheric gas elements, a problem occurs that the detected signal includes background components caused by residual gas along with contained components. Relating to this issue, an available method to quantify the contained components by separating the background ones had been established for Dynamic SIMS. Time‐of‐Flight SIMS with sputtering ion gun has also applied for depth profiling as well as Dynamic SIMS. However, few studies have attempted to investigate the secondary ion behavior of the atmospheric gas elements for depth profiling by Time‐of‐flight SIMS, especially for low concentration levels. In this study, experimental examinations of the secondary ions of the atmospheric gas elements, such as oxygen, hydrogen, and carbon in the silicon substrate, has been conducted in various analytical conditions of TOF‐SIMS depth profiling mode. Under the analytical conditions of our study, it has been proved that the background intensity of these elements was correlated to the sputtering rate. For the analysis of Floating Zone Silicon substrate, the oxygen intensity of the background component was proportional to the inverse number of the sputtering rate. Based on these facts, the total detected intensity of the atmospheric gas elements was able to be separated into the contained components and background ones by changing the sputtering rate during TOF‐SIMS measurement. An experimental result has shown that the contained oxygen concentration in the Czochralsk Silicon substrate estimated by the “TOF‐SIMS Raster Change Method” has successfully agreed with the result by the Dynamic SIMS.

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  8. [해외논문]   The improvement in interfacial shear strength of wood fiber/epoxy composite by sizing with epoxy sizing agent containing MWCNTs  

    He, Runqin (School of Mechanical and Electrical Engineering, Ningbo Dahongying University, No. 899 Xueyuan Road, Haishu District, Ningbo, ZheJiang Province, 315175, China) , Chang, Qiuxiang (School of Mechanical and Electrical Engineering, Ningbo Dahongying University, No. 899 Xueyuan Road, Haishu District, Ningbo, ZheJiang Province, 315175, China) , Peng, Chunzheng (School of Physical culture, Taizhou University, Linhai, ZheJiang Province, 317000, China)
    Surface and interface analysis : SIA v.50 no.8 ,pp. 807 - 812 , 2018 , 0142-2421 ,

    초록

    This paper discloses a feasible and high efficient strategy for wood fiber treatment to introducing multi‐wall carbon nanotubes (MWCNTs) to the surface of wood fibers for the aim of improving the interfacial shear strength of wood fiber/epoxy composite. Briefly, a layer of MWCNT was deposited on wood fibers through sizing wood fibers with epoxy sizing agent containing amine‐treated MWCNTs (MWCNT‐PEI). The surface functional groups, morphology, wettability, and interphase properties of MWCNTs on the surface of wood fiber were studied. The remarkable enhancements were achieved in interfacial shear strength of reinforced composites by dipping wood fiber in MWCNTCOOH suspension and wood fiber sizing containing MWCNT‐PEI.

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  9. [해외논문]   The oscillatory adsorption of self‐assembled organosilane films on aluminium oxide surfaces  

    Sims, R. A. (Flinders Institute for NanoScale Science and Nanotechnology, College of Science and Engineering, Flinders University, GPO Box 2100, Adelaide, SA, 5001, Australia) , Harmer‐ (Flinders Institute for NanoScale Science and Nanotechnology, College of Science and Engineering, Flinders University, GPO Box 2100, Adelaide, SA, 5001, Australia) , Bassell, S. L. (Flinders Institute for NanoScale Science and Nanotechnology, College of Science and Engineering, Flinders University, GPO Box 2100, Adelaide, SA, 5001, Australia) , Quinton, J. S.
    Surface and interface analysis : SIA v.50 no.8 ,pp. 813 - 818 , 2018 , 0142-2421 ,

    초록

    The time‐dependent oscillatory growth mechanism of organosilane film self‐assembly on aluminium oxide has been investigated using X‐ray photoelectron spectroscopy. While this unusual oscillatory process has been reported for the trifunctional silane, propyltrimethoxysilane, we report here, for the first time, that this oscillatory behaviour is also present during the self‐assembly of the difunctional silane propylmethyldimethoxysilane. The presence of multiple oscillations in this growth mechanism is also first reported for propyltrimethoxysilane and propylmethyldimethoxysilane as a function of exposure time. Multiple oscillations indicate that the 3‐component model that is used to describe and fit a single coverage oscillation must be reconsidered and contain additional components to account for the multiple oscillations seen experimentally. The absence of such oscillatory behaviour in the growth of the monofunctional organosilane propyldimethylmethoxysilane, which in fact follows a Langmuir‐type growth mechanism, indicates that this measurable oscillatory behaviour is because of the ability of multifunctional silanes to oligomerise both on the substrate and in solution.

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  10. [해외논문]   Study on surface structure of plasma‐treated polydimethylsiloxane (PDMS) elastomer by slow positron beam  

    Wang, Zheng (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , Luo, Yi (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , Zheng, Feng (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , Zhang, Ni (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , Yin, Chongshan (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , Li, Jingjing (Department of Physics and Hubei Nuclear‐Solid Physics Key Laboratory, Wuhan University, Wuhan, 430072, China) , He, Chunqing (Department of Physics and Hubei Nuclear‐Solid Physics Key) , Peng, Xiangyang , Huang, Zhen , Fang, Pengfei
    Surface and interface analysis : SIA v.50 no.8 ,pp. 819 - 826 , 2018 , 0142-2421 ,

    초록

    In this paper, the variations in surface structure of polydimethylsiloxane elastomers before and after argon plasma treatments have been investigated by X‐ray photoelectron spectroscopy, slow positron beam, and scanning electron microscope. An inorganic silica‐like layer was probed by X‐ray photoelectron spectroscopy after 3 minutes or longer time of treatments, and the sample surface turned into totally hydrophilic. Short time (1 and 2 min) plasma exposure mainly removed preexisting low molecular weighted (LMW) siloxanes on sample surface. By using slow positron beam, the thicknesses of silica‐like layer for 3‐, 5‐, and 10‐minute–treated samples were estimated to be around 30, 66, and 91 nm, respectively. Beneath the silica‐like layer, a loose polymeric structure was also detected, which was ascribed to the accumulation of LMW siloxanes. Scanning electron microscope images showed that the silica‐like layer cracked after 10 minutes of plasma treatment, which provided direct diffusion pathways for LMW siloxanes. Hence, 10‐minute–treated sample showed rather low organic composition near surface. Slow positron beam provides valuable depth profile information for evaluating the surface aging condition of polydimethylsiloxane composite.

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