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Journal of the Optical Society of Korea 8건

  1. [국내논문]   Nano-structuring of Transparent Materials by Femtosecond Laser Pulses   피인용횟수: 1

    Sohn, Ik-Bu (Optical Network and Systems Laboratory, Information and Communication University ) , Lee, Man-Seop (Optical Network and Systems Laboratory, Information and Communication University ) , Chung, Jung-Yong (Phoco Co. Ltd. ) , Cho, Sung-Hak (Intelligency&, Precision Machine Dept., KIMM)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 1 - 5 , 2005 , 1226-4776 ,

    초록

    Using tightly focused femtosecond laser pulses, we produce an optical waveguide and optical devices in transparent materials. This technique has the potential to generate not only channel waveguides, but also three-dimensional optical devices. In this paper, an optical splitter and U-grooves, which are used for fiber alignment, are simultaneously fabricated in a fused silica glass using near-IR femtosecond laser pulses. The fiber aligned optical splitter has a low insertion loss, less than 4㏈, including an intrinsic splitting loss of 3㏈ and excess loss due to the passive alignment of a single-mode fiber. Finally, we demonstrate the utility of the femtosecond laser writing technique by fabricating gratings at the surface and inside the silica glass.

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    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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  2. [국내논문]   Analysis of Fiber Nonlinearities by Perturbation Method   피인용횟수: 1

    Lee Jong-Hyung (Department of Electronic Engineering, Dongeui University ) , Han Dae-Hyun (Department of Electronic Engineering, Dongeui University ) , Choi Byeong-Yoon (Department of Computer Engineering, Dongeui University)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 6 - 12 , 2005 , 1226-4776 ,

    초록

    The perturbation approach is applied to solve the nonlinear Schrodinger equation, and its valid range has been determined by comparing with the results of the split-step Fourier method over a wide range of parameter values. With γ= 2㎞/sup -1/mW/sup -1/, the critical distance for the first order perturbation approach is estimated to be(equation omitted). The critical distance, Z/sub c/, is defined as the distance at which the normalized square deviation compared to the split-step Fourier method reaches 10/sup -3/. Including the second order perturbation will increase Z/sub c/ more than a factor of two, but the increased computation load makes the perturbation approach less attractive. In addition, it is shown mathematically that the perturbation approach is equivalent to the Volterra series approach, which can be used to design a nonlinear equalizer (or compensator). Finally, the perturbation approach is applied to obtain the sinusoidal response of the fiber, and its range of validity has been studied.

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    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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  3. [국내논문]   Chromatic Dispersion Tolerance of the SSB-Modulated Signals  

    Park Sang-Gyu (Hanyang University)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 13 - 15 , 2005 , 1226-4776 ,

    초록

    It is shown that the SSB modulated signal has smaller chromatic-dispersion induced penalty than the DSB modulated signal only when the accumulated dispersion is large. When the accumulated dispersion is small, the SSB modulated signal has larger dispersion penalty than the DSB modulated signal. Therefore, if one builds a system with very low dispersion penalty, SSB modulation may end up with a larger dispersion penalty.

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    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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  4. [국내논문]   Fabrication of Nano Dot and Line Arrays Using NSOM Lithography   피인용횟수: 1

    Kwon Sangjin (Department of Mechatronics, Gwangju Institute of Science and Technology ) , Kim Pilgyu (Department of Mechatronics, Gwangju Institute of Science and Technology ) , Jeong Sungho (Department of Mechatronics, Gwangju Institute of Science and Technology ) , Chang Wonseok (Nanoprocessing Group, Korea Institute of Machinery and Materials ) , Chun Chaemin (Department of Materials Science and Engineering, Gwangju Institute of Science and Technology ) , Kim Dong-Yu (Department of Materials Science and Engineering, Gwangju Institute of Science and Technology)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 16 - 21 , 2005 , 1226-4776 ,

    초록

    Using a cantilever type nanoprobe having a 100㎚m aperture at the apex of the pyramidal tip of a near-field scanning optical microscope (NSOM), nanopatterning of polymer films are conducted. Two different types of polymer, namely a positive photoresist (DPR-i5500) and an azopolymer (Poly disperse orange-3), spincoated on a silicon wafer are used as the substrate. A He-Cd laser with a wavelength of 442㎚ is employed as the illumination source. The optical near-field produced at the tip of the nanoprobe induces a photochemical reaction on the irradiated region, leading to the fabrication of nanostructures below the diffraction limit of the laser light. By controlling the process parameters properly, nanopatterns as small as 100㎚ are produced on both the photoresist and azopolymer samples. The shape and size variations of the nanopatterns are examined with respect to the key process parameters such as laser beam power, irradiation time or scanning speed of the probe, operation modes of the NSOM (DC and AC modes), etc. The characteristic features during the fabrication of ordered structures such as dot or line arrays using NSOM lithography are investigated. Not only the direct writing of nano array structures on the polymer films but also the fabrication of NSOM-written patterns on the silicon substrate were investigated by introducing a passivation layer over the silicon surface. Possible application of thereby developed NSOM lithography technology to the fabrication of data storage is discussed.

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    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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  5. [국내논문]   High Precision Measurement of 3D Profile Using Confocal Differential Heterodyne Interferometer   피인용횟수: 1

    Kim Taejoong (Dept. of Mechanical Engineering KAIST ) , Lee SeungWoo (Dept. of Mechanical Engineering KAIST ) , Gweon Dae-Gab (Dept. of Mechanical Engineering KAIST)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 22 - 25 , 2005 , 1226-4776 ,

    초록

    The differential heterodyne interferometer (DHI) is suitable for precise measurement of step height and line width, since its differential configuration can significantly reduce disturbances from the environment [1,2]. Like most phase measuring interferometers, however, the DHI is limited, in that it can obtain only the phase from 0 to 2π, because of the sinusoidal nature of the optical interference involved. Thus, the measurable step height is limited to one quarter of the wavelength of the light source. This study describes a confocal differential heterodyne interferometer (CDHI) for measuring step heights of several micrometers, with a high resolution and line width with high repeatability. The CDHI has a simple structure and rapid measurement speed.

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    무료다운로드 유료다운로드

    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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  6. [국내논문]   Measurement of Sub-micrometer Features Based on The Topographic Contrast Using Reflection Confocal Microscopy  

    Lee SeungWoo (Dept. of Mechanical Eng, KAIST ) , Kang DongKyun (Dept. of Mechanical Eng, KAIST ) , Yoo HongKi (Dept. of Mechanical Eng, KAIST ) , Kim TaeJoong (Dept. of Mechanical Eng, KAIST ) , Gweon Dae-Gab (Dept. of Mechanical Eng, KAIST ) , Lee Suk-Won (Micro Nano System Technology R/D LAB, Samsung Electronics Co. Ltd, ) , Kim Kwang-Soo (Micro Nano System Technology R/D LAB, Samsung Electronics Co. Ltd,)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 26 - 31 , 2005 , 1226-4776 ,

    초록

    We describe the design and the implementation of video-rate reflection confocal scanning microscopy (CSM) using an acousto-optical deflector (AOD) for the fast horizontal scan and a galvanometer mirror (GM) for the slow vertical scan. Design parameters of the optical system are determined for optimal resolution and contrast. The OSLO simulations show that the performances of CSM are not changed with deflection angle and the wavefront errors of the system are less than 0.012λ. To evaluate the performances of designed CSM, we do a series of tests, measuring lateral and axial resolution, real time image acquisition. Due to a higher axial resolution compared with conventional microscopy, CSM can detect the surface of sub-micrometer features. We detect 138㎚ line shape pattern with a video-rate (30 frm/sec). And 10㎚ axial resolution is archived. The lateral resolution of the topographic images will be further enhanced by differential confocal microscopy (DCM) method and computational algorithms.

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    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

    이미지

    Fig. 1 이미지
  7. [국내논문]   Lateral Resolution Enhancement in Confocal Self-interference Microscopy with Commercial Calcite Plate   피인용횟수: 1

    Kang DongKyun (Nano Opto Mechatronics Lab., Dept. of Mechanical Engineering KAIST ) , Yoo HongKi (Nano Opto Mechatronics Lab., Dept. of Mechanical Engineering KAIST ) , Lee SeungWoo (Nano Opto Mechatronics Lab., Dept. of Mechanical Engineering KAIST ) , Gweon Dae-Gab (Nano Opto Mechatronics Lab., Dept. of Mechanical Engineering KAIST)
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 32 - 35 , 2005 , 1226-4776 ,

    초록

    In light microscopy, spatial resolution is limited by diffraction effect. Confocal microscopy has improved resolutions in both lateral and axial directions, but these are still limited by diffraction effect. Confocal self-interference microscopy (CSIM) uses interference between two perpendicularly polarized beams to enhance lateral resolution. In previous research, we proposed a calcite plate with its optic-axis perpendicular to the propagation angle and one of the boundary surfaces of the plate. This type of plate is not widely used to our knowledge. In this paper, we change the calcite plate to more common one, which is commercially available. This calcite plate has its optic axis in the plane of incidence. We analyze the characteristics of this calcite plate and numerically compare the performances of CSIM in previous research and CSIM with the commercial calcite plate. Numerical results show improved performance when using the commercial calcite plate

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    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

    이미지

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  8. [국내논문]   Information for Contributors etc.  

    편집부
    Journal of the Optical Society of Korea v.9 no.1 ,pp. 36 - 37 , 2005 , 1226-4776 ,

    초록

    In light microscopy, spatial resolution is limited by diffraction effect. Confocal microscopy has improved resolutions in both lateral and axial directions, but these are still limited by diffraction effect. Confocal self-interference microscopy (CSIM) uses interference between two perpendicularly polarized beams to enhance lateral resolution. In previous research, we proposed a calcite plate with its optic-axis perpendicular to the propagation angle and one of the boundary surfaces of the plate. This type of plate is not widely used to our knowledge. In this paper, we change the calcite plate to more common one, which is commercially available. This calcite plate has its optic axis in the plane of incidence. We analyze the characteristics of this calcite plate and numerically compare the performances of CSIM in previous research and CSIM with the commercial calcite plate. Numerical results show improved performance when using the commercial calcite plate

    원문보기

    원문보기
    무료다운로드 유료다운로드

    회원님의 원문열람 권한에 따라 열람이 불가능 할 수 있으며 권한이 없는 경우 해당 사이트의 정책에 따라 회원가입 및 유료구매가 필요할 수 있습니다.이동하는 사이트에서의 모든 정보이용은 NDSL과 무관합니다.

    NDSL에서는 해당 원문을 복사서비스하고 있습니다. 아래의 원문복사신청 또는 장바구니담기를 통하여 원문복사서비스 이용이 가능합니다.

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